“A view from the other side of technology: SSL, market forces, politics, and communication” – Dale Work
Characterisation of Fluorescent Materials (Sven Leyre) Results of a Nationwide Intercomparison of Infrared Spectral Reflectance Capabilities – (Boris Wilthan/Leonard Hanssen) A high-power, tunable, supercontinuum-based VIS-SWIR light source for the STARR II gonioreflectometer (Heather Patrick/and Clarence J. Zarobila) Integrating sphere superposition technique for quantifying the linearity of InGaAs detectors (Angelo Arecchi) Laboratory versus Production SSL Metrology: Lessons and Questions from CALiPER (Mia Paget – Presented by Eric Richman) Thermal issues in relation to metrics reported on LED data sheets (Andras Poppe) Calibrating Optical Sensors for Semiconductor Process Control (John Corless) CALiPER Deep Dive Long-Term Testing—Correlation from SSL Device Performance to End Product (Mia Paget – Presented by Eric Richman)
Frank Grum Memorial Lecture
Optical Properties of Materials
Laboratory Versus Production SSL Metrology