CORM Technical Committees are set up to have a group of knowledgeable individuals study a particular problem or series of problems in the fields of optical radiation measurement; however, membership in any sub-committee is open to any CORM member with an interest. There are currently two major technical committees, CORM Radiometry (CR) and Optical Properties of Materials (OPM), each with a set of sub-committees that study particular problems. Most sub-committees have email reflectors set up to post questions or to relay time-sensitive information to all its members.

CORM Radiometry (CR)

The CR committee is chaired by Dr. Richard Young. CR sub-committees are concerned with detectors, detector arrays, optical sources, and the measurement of light (photometry). There are five radiometry sub-committees.

The active CR sub-committees are:

• CR-1 Lamp Sources is chaired by Mr. David Gross (Osram Sylania)
• CR-3 Photometry, is headed by Dr. Cameron Miller (NIST). The CR-3 mission is "To identify and quantify problems, to address needs, and to disseminate information on standards and procedures in photometry including broadband and spectral measurements, colorimetry of light sources, and evaluation of photometers."
• CR-5 Electronic Displays, is headed by Dr. Steve Brown (NIST) is concerned with the measurement and specification thereof.
• CR-6 Diode Array Spectroradiometry is chaired by Mr. Daryl Myers (NREL).
• CR-7 Measurement of LED's is chaired Dr. Kathleen Muray (InPhoRa)
• CR-8 Solid State Lighting, chaired Dr. Yoshi Ohno (NIST)  

Optical Properties of Materials (OPM)

The OPM Committee is chaired by Dr. Ellen Carter. OPM sub-committees deal with artifact standards and methodology dealing with spectrophotometric measurements, including specifications of artifact standards, measurement geometry, and instrument and laboratory intercomparison.

The active Optical Properties sub-committees are:

• OP-1 Laboratory Intercomparison, chaired by Dr. Danny Rich (Sun Chemical Corporation) is concerned with the intercomparison of methods, and will sponsor round-robin measurements between laboratories, both national and industrial.
• OP-4 Retro-reflectance, is chaired by Todd Heimer (Gamma Scientific).Its concerns are with the measurement and specification of retro-reflective devices, including instrumentation for measurement and standards.
• OP-5 IR Optical Properties of Materials, is headed by Dr. Leonard M. Hanssen (NIST).